发明名称 Image defect inspection method, image defect inspection apparatus, and appearance inspection apparatus
摘要 In an image defect inspection method and apparatus, which detects a gray level difference between the corresponding portions of two images, automatically sets a threshold value based on the distribution of the detected gray level difference, compares the detected gray level difference with the threshold value, and judges one or the other of the portions to be defective if the gray level difference is larger than the threshold value, provisions are made to reduce the occurrence of false defects when there is a brightness difference between the two images undergoing the comparison. In the image defect inspection method, the brightness difference between the two images is computed (S 106 ), and the threshold value is determined in such a manner that the threshold value increases with the computed brightness difference (S 107 ).
申请公布号 US2006098863(A1) 申请公布日期 2006.05.11
申请号 US20050206706 申请日期 2005.08.17
申请人 ISHIKAWA AKIO;UEYAMA SHINJI 发明人 ISHIKAWA AKIO;UEYAMA SHINJI
分类号 G06K9/00 主分类号 G06K9/00
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