发明名称 THE TEST SYSTEM AND METHOD OF THE ELECTRIC DEVICE
摘要 <p>A test system and test method for testing an electromagnetic device are disclosed. The test system and test method are capable of reducing the test time and enhancing the test reliability when testing the electromagnetic device. The present invention receives audio signals outputted from the electromagnetic device as a target to be tested and obtains a root mean square (RMS) value of the audio signals, and compares the RMS value with the predetermined reference value to determine the state of the electromagnetic device. Also, the present invention receives audio signals outputted from the electromagnetic device as a target to be tested, processes the audio signals by Fourier transform, and compares the Fourier transform result with a predetermined reference value to determine the state of the electromagnetic device. Moreover, the present invention receives video signals from the electromagnetic device to be tested, detects synchronous signals of the video signals and compares the synchronous signals with a predetermined reference synchronous signal to determine the state of the electromagnetic device.</p>
申请公布号 WO2006049353(A1) 申请公布日期 2006.05.11
申请号 WO2004KR02776 申请日期 2004.11.01
申请人 GU, HYUN SUNG;SAMSUNG ELECTRONICS CO., LTD. 发明人 GU, HYUN SUNG
分类号 (IPC1-7):G06F11/22 主分类号 (IPC1-7):G06F11/22
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