发明名称 Method of manufacturing a transistor and a method of forming a memory device with isolation trenches
摘要 A method of manufacturing a transistor. In one embodiment, the method includes forming a gate electrode by defining a gate groove in the substrate. A plate-like portion is defined in each of the trenches at a position adjacent to the groove so that the two plate-like portions will be connected with the groove and the groove is disposed between two plate-like portions. In one embodiment, the two plate-like portions are defined by an etching process which selectively etches the isolating material of the isolation trenches with respect to the semiconductor substrate material. A gate insulating material is provided at an interface between the active area and the groove and the interface between the active area and the plate-like portions, and a gate electrode material is deposited so as to fill the groove and the two plate-like portions.
申请公布号 US7442609(B2) 申请公布日期 2008.10.28
申请号 US20050222613 申请日期 2005.09.09
申请人 INFINEON TECHNOLOGIES AG 发明人 WANG PENG-FEI;NUETZEL JOACHIM;WEIS ROLF;SCHLOESSER TILL;STRASSER MARC;LUYKEN RICHARD JOHANNES
分类号 H01L21/336 主分类号 H01L21/336
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