发明名称 HIGH PERFORMANCE CMOS DEVICES AND METHODS FOR MAKING SAME
摘要 An integrated circuit having high performance CMOS devices with good short channel effects may be made by forming a gate structure over a substrate; forming pocket implant regions and source/drain extensions in the substrate; forming spacers along sides of the gate structure; and thermal annealing the substrate when forming the spacers, the thermal annealing performed at an ultra-low temperature. An integrated circuit having high performance CMOS devices with low parasitic junction capacitance may be made by forming a gate structure over a substrate; forming pocket implant regions and source/drain extensions in the substrate; forming spacers along sides of the gate structure; performing a low dosage source/drain implant; and performing a high dosage source/drain implant.
申请公布号 US2008305590(A1) 申请公布日期 2008.12.11
申请号 US20080191868 申请日期 2008.08.14
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 WANG CHIH-HAO;WANG TA-WEI;HU CHENMING
分类号 H01L21/8238 主分类号 H01L21/8238
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