发明名称 SEMICONDUCTOR MEMORY DEVICE AND ITS TEST METHOD
摘要 PROBLEM TO BE SOLVED: To contribute to improvement of yield of products and reliability by enabling minute adjustment of timing of activation of wordlines of first and second ports during a test, by enabling a test in the worst case, and by improving accuracy of a test. SOLUTION: Timing control of activation of wordlines WLA, WLB of ports A, B are performed respectively based on clock signals (CLKA, CLKB), signals for test (TESTA, TESTB) are provided according to the clock signals (CLKA, CLKB) controlling respectively timing of activation of word lines of the ports A, B, TESYA is in an activation state in cells in which the ports A, B are selected, when TESTB is in a non activation state, the clock signal CLKB is masked and activation of the wordlines WLA, WLB of the ports A, B is controlled in response to the clock signal CLKA, further minute adjustment of timing difference (0 is included) of activation of the wordlines WLA, WLB of the ports A, B is performed by a signal from a terminal DLY. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008299991(A) 申请公布日期 2008.12.11
申请号 JP20070146875 申请日期 2007.06.01
申请人 NEC ELECTRONICS CORP 发明人 OSADA TOSHIYA
分类号 G11C29/04 主分类号 G11C29/04
代理机构 代理人
主权项
地址