| 摘要 |
PROBLEM TO BE SOLVED: To provide a test board and a testing method which enables high-speed testing, using simple configuration. SOLUTION: The test board is provided with a socket for mounting a non-test device, and first and second signal lines connected between an output terminal, an input terminal of the non-test device and a switch, respectively. First and second resistance elements in which impedance is smaller than the first signal line and the second signal line are provided, between the first signal line and the switch and between the second signal line and the switch respectively. A third signal line for connecting the resistance element and a tester via the switch and a fourth signal line for connecting the second resistance element and the tester are provided. The switch is connected between the first and second resistance elements, and the first resistance element and the third signal line are connected, at a direct current and a low-speed test or timing calibration. COPYRIGHT: (C)2009,JPO&INPIT
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