| 摘要 |
An electronic part test apparatus using a prism can improve the per-minute test speed by reducing the product feed pitch and minimize the image distortion by changing the optical path through the prism. An electronic part test apparatus using a prism(540) comprises a feeder moving electronic parts supplied through a hopper with vibration, a linear feeder which has a predetermined length in order to supply the electronic parts successively, a rotating unit which is made of glass plate in order to facilitate inspection of the electronic parts, an alignment unit for arranging the electronic parts in a row, an imaging unit for imaging the edge shape of the arranged electronic parts, and a sorting unit classifying the inspection-completed electronic parts into good and inferior ones. The imaging unit includes an optical path modification unit changing the optical path so that a camera acquires images of more than two faces of the electronic part at the same time.
|
