发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVUCE
摘要 A capacitor in which a ferroelectric film (4) is held between a lower electrode (3) and an upper electrode (5) is formed above a conductive plug (1), with a conductive base structure (2) interposed therebetween. A hard mask (6) used in patterning the conductive base structure (2) is formed on the upper electrode (5). A protective film (7) covering at least an exposed portion of the ferroelectric film (4) is formed and then heat treatment is applied to the ferroelectric film (4) in an oxygen gas atmosphere. This prevents elements constituting the ferroelectric film (4) from being released to the outside at the time of the heat treatment by thus forming the protective film (7) before applying the heat treatment to the ferroelectric film (4). Further, oxygen penetration into the conductive plug (1) is blocked by applying the heat treatment in the state where the conductive base structure (2) is not patterned.
申请公布号 KR20080098064(A) 申请公布日期 2008.11.06
申请号 KR20087022471 申请日期 2008.09.12
申请人 FUJITSU LIMITED 发明人 WANG WENSHENG
分类号 H01L27/108 主分类号 H01L27/108
代理机构 代理人
主权项
地址