发明名称 Method of fabricating semiconductor device
摘要 A method of fabricating a semiconductor device includes steps of forming a gate electrode on the surface of a region of a semiconductor substrate provided with a first element, forming an insulating film to cover the surface of the gate electrode and another region of the semiconductor substrate provided with a second element and forming a sidewall insulating film covering the side surface of the gate electrode while leaving the insulating film on the region of the semiconductor substrate provided with the second element by a prescribed thickness by etching the insulating film up to an intermediate portion from the surface thereof.
申请公布号 US2008254583(A1) 申请公布日期 2008.10.16
申请号 US20080078313 申请日期 2008.03.28
申请人 TAKAHASHI KEN-ICHI;IBARA YOSHIKAZU 发明人 TAKAHASHI KEN-ICHI;IBARA YOSHIKAZU
分类号 H01L21/8249 主分类号 H01L21/8249
代理机构 代理人
主权项
地址