发明名称 CUSHION FOR POLISHING PAD AND POLISHING PAD USING THE CUSHION
摘要 <p>This invention provides a polishing pad that can achieve polishing which can realize excellent flatness of a polished surface and evenness of the film thickness after polishing, and, at the same time, can realize a high polishing rate, and also has excellent polishing evenness of a polishing object such as an insulating film or a metallic film, and a cushion using the polishing pad. The cushion satisfies the requirements that, in the measurement of the dynamic compression viscoelasticity under conditions of 23°C, static load 27.6 kPa, frequency 11 Hz, and amplitude 1 µm, (1) the difference in phase between dynamic stress and deformation is not more than 4 degrees, and (2) the ratio of the maximum value of the deformation to the maximum value of the dynamic stress ([maximum value of deformation]/[maximum value of dynamic stress]) is not less than 0.5 µm/kPa. The polishing pad comprises the cushion layer for a polishing pad and a polishing layer.</p>
申请公布号 WO2008123085(A1) 申请公布日期 2008.10.16
申请号 WO2008JP55030 申请日期 2008.03.19
申请人 KURARAY CO., LTD.;KATO, MITSURU;KIKUCHI, HIROFUMI;KATO, SHINYA 发明人 KATO, MITSURU;KIKUCHI, HIROFUMI;KATO, SHINYA
分类号 B24B37/24;H01L21/304 主分类号 B24B37/24
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