| 摘要 |
The present invention is an apparatus for testing a power supply. A power supply testing apparatus may include a remote load which may sink an adjustable amount of current with an adjustable slew rate and may test the response of the power supply to determine its operability with a dynamic load. Additionally, in an alternative embodiment of the invention, the testing apparatus may source an adjustable amount of current with an adjustable slew rate to the output of a power supply. In yet another embodiment of the invention, the testing apparatus may include an adjustable current sink and adjustable current source with an adjustable slew rate. The power supply testing apparatus of the present invention may be implemented with standard circuit components on a circuit board and thus provide a small form factor. Additionally, due to the small form factor and low weight implementation, the power supply testing apparatus may utilize reduced length test wires which reduce the inductance in the test wires and increases the apparatus' slew rate for more effective testing.
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