发明名称 INSULATED GATE TRANSISTOR
摘要 A charge storage layer of first conductive type is formed on the first principal surface of a semiconductor substrate. A base layer of second conductive type is formed on the charge storage layer. Each trench formed through the base layer and the charge storage layer is lined with an insulating film and filled with a trench gate electrode. Dummy trenches are formed on both sides of each trench. Source layers of first conductive type are selectively formed in the surface of the base layer and in contact with the sidewalls of the trenches. The source layers are spaced apart from each other and arranged in the longitudinal direction of the trenches. A contact layer of second conductive type is formed in the surface of the base layer and between each two adjacent source layers arranged in the longitudinal direction of the trenches. A collector layer of second conductive type is formed on the second principal surface of the semiconductor substrate.
申请公布号 US2008224207(A1) 申请公布日期 2008.09.18
申请号 US20070843301 申请日期 2007.08.22
申请人 MITSUBISHI ELECTRIC CORPORATION 发明人 SAKAMOTO SHUNSUKE;SUEKAWA EISUKE;TSUNODA TETSUJIRO
分类号 H01L29/94 主分类号 H01L29/94
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