发明名称 Optical inspection apparatus and optical inspection method
摘要 An optical inspection apparatus for inspecting an inspection target surface by irradiating the inspection target surface with light, includes: a condensing and scanning optical system for condensing light from a light source on the inspection target surface in a minute spot shape and scanning the condensed minute-spot-shaped light onto the inspection target surface; and a phase change information detection apparatus for detecting optical phase change information in an area of the inspection target surface irradiated with the minute-spot-shaped light scanned by the condensing and scanning optical system.
申请公布号 US7423745(B2) 申请公布日期 2008.09.09
申请号 US20050230329 申请日期 2005.09.20
申请人 NEC CORPORATION 发明人 MORIBE HIDEYUKI;TATENO MOTONARI
分类号 G01N21/00;G01B11/24;G01N21/956;G03F1/32;G03F1/84;H01L21/027 主分类号 G01N21/00
代理机构 代理人
主权项
地址
您可能感兴趣的专利