发明名称 Free-Standing III-N layers or devices obtained by selective masking of III-N layers during III-N layer growth
摘要 A free-standing III-N wafer, wherein III denotes at least one element of the group III of the periodic Table of Elements, selected from Al, Ga and In, is obtained by a process comprising providing a III-N layer having a surface, which comprises more than one facet, and selectively depositing a mask material only on one or multiple, but not on all facets during a III-N layer growth process. Thereby, it is possible to produce free-standing thick III-N layers. Further, semiconductor devices or components having special structures and layers can be produced.
申请公布号 EP1965416(A2) 申请公布日期 2008.09.03
申请号 EP20080009577 申请日期 2006.11.28
申请人 FREIBERGER COMPOUND MATERIALS GMBH 发明人 HABEL, FRANK;SCHOLZ, FERDINAND;NEUBERT, BARBARA;BRUECKNER, PETER;WUNDERER, THOMAS
分类号 H01L21/20 主分类号 H01L21/20
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