发明名称 POLISHING PAD HAVING PATTERN WITH GROOVE FOR USE IN CHEMICAL MECHANICAL POLISHING DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a chemical mechanical polishing (CMP) device solving the problem of unequal rate of polishing over the whole substrate. <P>SOLUTION: This polishing pad for polishing the substrate used in the chemical mechanical polishing device is provided with a polishing surface having: a first polishing region; a second polishing region surrounding the first polishing region; and a spiral groove formed on the polishing surface. The spiral groove has a first pitch in the first polishing region and a second pitch different from the first pitch in the second polishing region. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008188768(A) 申请公布日期 2008.08.21
申请号 JP20080126431 申请日期 2008.05.13
申请人 APPLIED MATERIALS INC 发明人 OSTERHELD TOM;KO SEN-HOU;BENNETT DOYLE EDWARD;REDEKER FRED C;ADDIEGO GINETTO
分类号 B24B37/26;B24D13/14;H01L21/304 主分类号 B24B37/26
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