发明名称 |
POLISHING PAD HAVING PATTERN WITH GROOVE FOR USE IN CHEMICAL MECHANICAL POLISHING DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a chemical mechanical polishing (CMP) device solving the problem of unequal rate of polishing over the whole substrate. <P>SOLUTION: This polishing pad for polishing the substrate used in the chemical mechanical polishing device is provided with a polishing surface having: a first polishing region; a second polishing region surrounding the first polishing region; and a spiral groove formed on the polishing surface. The spiral groove has a first pitch in the first polishing region and a second pitch different from the first pitch in the second polishing region. <P>COPYRIGHT: (C)2008,JPO&INPIT |
申请公布号 |
JP2008188768(A) |
申请公布日期 |
2008.08.21 |
申请号 |
JP20080126431 |
申请日期 |
2008.05.13 |
申请人 |
APPLIED MATERIALS INC |
发明人 |
OSTERHELD TOM;KO SEN-HOU;BENNETT DOYLE EDWARD;REDEKER FRED C;ADDIEGO GINETTO |
分类号 |
B24B37/26;B24D13/14;H01L21/304 |
主分类号 |
B24B37/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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