发明名称 Dynamic random access memory
摘要 A DRAM structure on a silicon substrate has an active area, gate conductors, deep trench capacitors, and vertical transistors. The deep trench capacitors are formed at intersections of the active area and the gate conductors, and each deep trench capacitor is coupled electrically to the corresponding vertical transistor to form a memory cell. The transistor includes a gate, a source in a lateral side of the gate, and a drain in another lateral side of the gate The depth of the drain is different from the depth of the source.
申请公布号 US7408215(B2) 申请公布日期 2008.08.05
申请号 US20070696160 申请日期 2007.04.03
申请人 NANYA TECHNOLOGY CORP. 发明人 CHANG MING-CHENG;SHIH NENG-TAI
分类号 H01L27/108;H01L29/76;H01L29/94;H01L31/119 主分类号 H01L27/108
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