发明名称 Semiconductor device and method for manufacturing the same
摘要 A semiconductor device includes: a semiconductor substrate; a source region and a drain region formed at a distance from each other in the semiconductor substrate; a first insulating film formed on a portion of the semiconductor substrate, the portion being located between the source region and the drain region; a charge storage film formed on the first insulating film; a second insulating film formed above the charge storage film and made of a high-permittivity material; a control gate electrode formed above the second insulating film; and a silicon nitride layer including nitrogen atoms having three-coordinate nitrogen bonds, at least one of second-nearest neighbor atoms of the nitrogen atoms being a nitrogen atom. At least one of the charge storage film and the control gate electrode contains silicon, the silicon nitride layer is located between the second insulating film and the at least one of the charge storage film and the control gate electrode.
申请公布号 US2008173927(A1) 申请公布日期 2008.07.24
申请号 US20070896860 申请日期 2007.09.06
申请人 SAKUMA KIWAMU;MATSUSHITA DAISUKE;KATO KOICHI;NAKASAKI YASUSHI;HIRANO IZUMI;MURAOKA KOUICHI;MITANI YUICHIRO;FUKATSU SHIGETO;ITO TOSHIHIDE 发明人 SAKUMA KIWAMU;MATSUSHITA DAISUKE;KATO KOICHI;NAKASAKI YASUSHI;HIRANO IZUMI;MURAOKA KOUICHI;MITANI YUICHIRO;FUKATSU SHIGETO;ITO TOSHIHIDE
分类号 H01L29/788;H01L21/336;H01L29/792 主分类号 H01L29/788
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