发明名称 METHOD FOR INSPECTING TAB PROCESS
摘要 A TAB inspecting method is provided to correct a process condition corresponding to heat expansion of a tape carrier by inducing a heat expansion correction system of tape carrier during TAB inspection, thereby optimizing a TAB align state. A TAB inspecting method comprises the following steps. A module is provided. In the module, a TAB(Tape Automated Bonding) bonding process between a tape carrier and an LC(Liquid Crystal) panel and between the tape carrier and a PCB(Printed Circuit Board) is completed. A TAP align state is confirmed in the module. By measuring a heat expansion amount of the tape carrier in the module where the align confirmation is completed, a TAP process condition is corrected. By performing TAB inspection, it is inspected where a defect is present in the module.
申请公布号 KR20080062944(A) 申请公布日期 2008.07.03
申请号 KR20060139143 申请日期 2006.12.29
申请人 LG DISPLAY CO., LTD. 发明人 KIM, SANG HYOUN;KIM, JIN HWA;HAN, CHANG LYUL
分类号 G02F1/1345;G02F1/13 主分类号 G02F1/1345
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