发明名称 AUTO PROBE UNIT
摘要 An auto probe unit is provided to contact a needle to a shorting bar having a large width and a long length, thereby significantly reducing connection faults between the needle and a panel driving IC during an image quality test and exactly performing the image quality test. A TCP(Tape Carrier Package)(130) transmits an inputted test signal. To one side of a panel driving IC(Integrated Circuit)(140), plural channels are attached. The panel driving IC supplies the test signal, transmitted through the TCP, to a tested display panel(200) through the channels. Plural shorting bars(150-1,150-2,150-3) are commonly connected with corresponding channels among channels of the panel driving IC. A needle(160) is selectively contacted with one shorting bar among the shorting bars to connect the panel driving IC with the tested display panel.
申请公布号 KR20080059871(A) 申请公布日期 2008.07.01
申请号 KR20060133730 申请日期 2006.12.26
申请人 LG DISPLAY CO., LTD. 发明人 LEE, EUN JUNG
分类号 G02F1/13;G01R1/067 主分类号 G02F1/13
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