发明名称 |
METHOD OF MANUFACTURING FERAM DEVICE |
摘要 |
A method for manufacturing a ferroelectric RAM(Random Access Memory) device is provided to prevent the lifting of an FEB(Ferro Barrier Layer) by forming an adhesive layer between interlayer dielectrics. A first interlayer dielectric(250) is formed on a substrate(210) to cover a ferroelectric capacitor(FeCAP). An adhesive layer(260) is formed on the first interlayer dielectric. A second interlayer dielectric(270) is formed on the adhesive layer. The second interlayer dielectric, the adhering layer, and the first interlayer dielectric are etched to form a contact hole which exposes an upper electrode(240). An FEB(Ferro Barrier Layer)(280) is formed on the entire surface of the contact hole. A metal wire(290) is formed on the entire surface of the contact hole on which the FEB is formed. A protective layer(299) is formed on the resultant substrate structure on which the metal wire is formed.
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申请公布号 |
KR20080050105(A) |
申请公布日期 |
2008.06.05 |
申请号 |
KR20060120927 |
申请日期 |
2006.12.01 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
PARK, NAM KYUN;HONG, SUK KYOUNG;CHANG, HEON YONG;PARK, HAE CHAN |
分类号 |
H01L27/105 |
主分类号 |
H01L27/105 |
代理机构 |
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主权项 |
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地址 |
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