发明名称 METHOD OF MANUFACTURING FERAM DEVICE
摘要 A method for manufacturing a ferroelectric RAM(Random Access Memory) device is provided to prevent the lifting of an FEB(Ferro Barrier Layer) by forming an adhesive layer between interlayer dielectrics. A first interlayer dielectric(250) is formed on a substrate(210) to cover a ferroelectric capacitor(FeCAP). An adhesive layer(260) is formed on the first interlayer dielectric. A second interlayer dielectric(270) is formed on the adhesive layer. The second interlayer dielectric, the adhering layer, and the first interlayer dielectric are etched to form a contact hole which exposes an upper electrode(240). An FEB(Ferro Barrier Layer)(280) is formed on the entire surface of the contact hole. A metal wire(290) is formed on the entire surface of the contact hole on which the FEB is formed. A protective layer(299) is formed on the resultant substrate structure on which the metal wire is formed.
申请公布号 KR20080050105(A) 申请公布日期 2008.06.05
申请号 KR20060120927 申请日期 2006.12.01
申请人 HYNIX SEMICONDUCTOR INC. 发明人 PARK, NAM KYUN;HONG, SUK KYOUNG;CHANG, HEON YONG;PARK, HAE CHAN
分类号 H01L27/105 主分类号 H01L27/105
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