发明名称 NONVOLATILE SEMICONDUCTOR MEMORY
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a nonvolatile semiconductor memory capable of improving writing efficiency and achieving a large memory capacity. <P>SOLUTION: The memory cell of the nonvolatile semiconductor memory is formed into a three-dimensional structure, and hot electrons caused by interband tunneling are generated near a drain, and further, the hot electrons are so injected into a charge accumulating layer disposed at a large solid angle with respect to to the end of its drain by the three-dimensional structure as to perform data writing. Thereby, in comparison with a writing method using conventional interband hot-electron injection, writing efficiency is improved, and achieved in large capacity by the three-dimensional structure and a multiple-stage laminating structure. <P>COPYRIGHT: (C)2008,JPO&INPIT</p>
申请公布号 JP2008117959(A) 申请公布日期 2008.05.22
申请号 JP20060300375 申请日期 2006.11.06
申请人 GENUSION:KK 发明人 ENDO TETSUO;AJIKA NATSUO
分类号 H01L21/8247;G11C16/04;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
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