发明名称 |
SEMICONDUCTOR DEVICE HAVING PROJECTING ELECTRODE FORMED BY ELECTROLYTIC PLATING, AND MANUFACTURING METHOD THEREOF |
摘要 |
A semiconductor device having a protruded electrode formed by an electrolytic plating and a method for manufacturing the same are provided to remove a dry film resist forming process and a peeling process by forming a foundation metal layer in an opening of an overcoat layer. A plurality of wires(8) are prepared on a semiconductor substrate(1). An overcoat layer(9) is formed on the semiconductor substrate including the wires and has an opening(10) formed on a section corresponding to a connection pad(2) of the wire. A foundation metal layer(11) is installed in the opening of the overcoat layer. A protruded electrode(12) is installed in the foundation metal layer in the opening of the overcoat layer. The foundation metal layer is formed on a circumference of the opening. The protruded electrode is installed on the foundation metal layer which is formed on the circumference of the opening. A solder ball is prepared on the protruded electrode. |
申请公布号 |
KR20080042010(A) |
申请公布日期 |
2008.05.14 |
申请号 |
KR20070113162 |
申请日期 |
2007.11.07 |
申请人 |
CASIO COMPUTER CO., LTD. |
发明人 |
KANEKO NORIHIKO |
分类号 |
H01L21/60;H01L23/12;H01L23/48;H01L23/52 |
主分类号 |
H01L21/60 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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