| 摘要 |
PROBLEM TO BE SOLVED: To shorten the analysis time of a power supply noise analysis model. SOLUTION: A computer 1 is allowed to function as an extraction means 2, a contact detection means 3, a model creation means 4, and a simulation execution means 5. The extraction means 2 extracts a contact pattern from layout data 6 in a semiconductor integrated circuit. A contact detection means 3 detects a contact nearest the circuit affected by noise from a pattern inside the semiconductor integrated circuit, or a group of contacts including the nearest contact. The model creation means 4 removes an element propagating noise via a substrate, to the contact detected by the contact detection means 3 from the generation source of noise for creating a model for data analysis. The simulation execution means 5 uses the created model for data analysis to conduct simulation. COPYRIGHT: (C)2008,JPO&INPIT
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