PROBE APPARATUS AND PROBE BLOCK INCLUDE THE SAME

摘要

A probe apparatus and a probe block having the same are provided to facilitate a repair process by connecting a driving chip to a contact unit and a connecting unit and firmly combining the contact unit and the connecting unit to a protruded part. A probe apparatus(1) is composed of plural contact units(3) directly contacting to plural electrode pads installed at a display panel and formed at the predetermined pitches corresponding to the electrode pad; plural connecting units(4) connected to a connection substrate; a plate(2) having a protruded part(21) where the contact units and the connecting units are formed; and a driving chip(5) of which one side is connected to the contact unit and the other side is connected to the connecting unit. The plate has a position aligning unit protruded on the surface opposite to the surface where the protruded part is formed.