发明名称 |
WAFER LEVEL CHIP SCALE PACKAGE |
摘要 |
A wafer level chip scale package is provided to reduce bending of a semiconductor chip by selectively forming an insulating layer only on a portion which is required for electrical connection of the semiconductor chip. An insulating layer(22) is selectively formed on a semiconductor substrate(21) having bonding pads to comprise only a region, in which a rewiring layer(24) is formed. The rewiring layer is formed on the insulating layer and electrically connected to the bonding pad of the semiconductor chip exposed from the insulating layer. A solder mask(23) is formed on the rewiring layer to form a ball land(25) to attach a mounting member.
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申请公布号 |
KR20080029261(A) |
申请公布日期 |
2008.04.03 |
申请号 |
KR20060095084 |
申请日期 |
2006.09.28 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
LEE, SEUNG HYUN;KIM, JONG HOON |
分类号 |
H01L23/48;H01L21/60 |
主分类号 |
H01L23/48 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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