发明名称 WAFER LEVEL CHIP SCALE PACKAGE
摘要 A wafer level chip scale package is provided to reduce bending of a semiconductor chip by selectively forming an insulating layer only on a portion which is required for electrical connection of the semiconductor chip. An insulating layer(22) is selectively formed on a semiconductor substrate(21) having bonding pads to comprise only a region, in which a rewiring layer(24) is formed. The rewiring layer is formed on the insulating layer and electrically connected to the bonding pad of the semiconductor chip exposed from the insulating layer. A solder mask(23) is formed on the rewiring layer to form a ball land(25) to attach a mounting member.
申请公布号 KR20080029261(A) 申请公布日期 2008.04.03
申请号 KR20060095084 申请日期 2006.09.28
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, SEUNG HYUN;KIM, JONG HOON
分类号 H01L23/48;H01L21/60 主分类号 H01L23/48
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