发明名称 DEVICE TESTING EQUIPMENT
摘要 PROBLEM TO BE SOLVED: To provide device testing equipment capable of performing power source control having high flexibility to load fluctuation with a simple circuit constitution. SOLUTION: This device testing equipment 100 executing an electric function test of a device to be tested by supplying a prescribed power to the device 140 to be tested from power source conversion parts 214, 216, and controlled by a center control part 210 is equipped with a signal processing part 212 transmitting/receiving data to/from the center control part between the center control part and the power source conversion parts. The power source conversion parts are characterized by being controlled in a closed loop by the signal processing part. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008076065(A) 申请公布日期 2008.04.03
申请号 JP20060252276 申请日期 2006.09.19
申请人 YOKOGAWA ELECTRIC CORP 发明人 NAKAMURA HIROSHI
分类号 G01R31/28 主分类号 G01R31/28
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