发明名称 TEMPERATURE DETECTING APPARATUS
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a temperature detecting apparatus capable of preventing incorrect output of a temperature signal in switching operation of a semiconductor switching element. <P>SOLUTION: This temperature detecting apparatus comprises a temperature detecting diode that is formed on the same chip as the semiconductor switching element and has a predetermined voltage characteristic to temperature fluctuation, and a constant current circuit for supplying current to an anode of the temperature detecting diode. The temperature detecting apparatus outputs, as a temperature signal, the anode potential of the temperature detecting diode. The temperature detecting apparatus has an anode potential keeping means for keeping, as a temperature signal, the anode potential of the temperature detecting diode in starting the switching operation of the semiconductor switching element. <P>COPYRIGHT: (C)2008,JPO&INPIT</p>
申请公布号 JP2008070300(A) 申请公布日期 2008.03.27
申请号 JP20060250765 申请日期 2006.09.15
申请人 MITSUBISHI ELECTRIC CORP 发明人 O AZUMA;YAMAMOTO AKIO
分类号 G01K7/01 主分类号 G01K7/01
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