发明名称 Method For The Nondestructive Material Testing Of Highly Pure Polycrystalline Silicon
摘要 Noncontaminating and nondestructive testing of a shaped polysilicon body for a material defect is accomplished by exposing the shaped polysilicon body to ultrasound waves, and the ultrasound waves are registered by an ultrasound receiver after they have passed through the shaped polysilicon body or reflected therein, so that material defects in the polysilicon are detected.
申请公布号 US2008053232(A1) 申请公布日期 2008.03.06
申请号 US20070842299 申请日期 2007.08.21
申请人 WACKER CHEMIE AG 发明人 HEGEN ANDREAS;SCHANTZ MATTHAEUS;LICHTENEGGER BRUNO
分类号 G01N29/04;G01B17/04 主分类号 G01N29/04
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