ERASE FUNCTION TESTING METHOD OF SEMICONDUCTOR NONVOLATILE MEMORY

摘要

PROBLEM TO BE SOLVED: To provide an erase function testing method of a semiconductor nonvolatile memory executing the erase function test in sector units in a short time.

SOLUTION: The erase function testing method of the semiconductor nonvolatile memory includes: a step (SO1) for carrying out an erase operation by specifying whole sectors by a decoder and for successively outputting sector specification signals by sector from the decoder to test the semiconductor nonvolatile memory, of which the correct batch erasing operation of whole bits is confirmed; a step (SO2) for verifying whether the sector specification signals are correctly output; and a step (SO3) for discriminating that the erase operation in sector units is normally executed when the sector specification signals are all correctly output.

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