| 摘要 |
<p>An examination apparatus is provided, the examination apparatus being capable of preventing difficulty in observing a specimen because of light emitted from markers. The examination apparatus includes a first image-acquisition unit configured to detect a movement related to a first image of light generated at a first region of the specimen; a second image-acquisition unit configured to observe a second image of light generated at a second region of the specimen; and a driving unit configured to cause the second image be to formed at substantially the same position in the second image-acquisition unit on the basis of a detection signal of the first image-acquisition unit. The first image includes at least an image that is different from the second image, and the driving unit controls the image position of the second image on the basis of the detection signal of the first image.
</p> |
