| 摘要 |
A circuit for detecting data error of a semiconductor memory apparatus is provided to increase the reliability of the semiconductor memory apparatus by repairing cells stored with data by discriminating one bit data error and data error with more than two bits. A data error correction unit(10) outputs correction data by comparing data with parity data. A data selection unit(100) outputs the data or the correction data as selection data in response to a test selection signal. A test result output unit(200) receives the selection data and the parity data, and outputs a test result signal in response to the test selection signal.
|
