发明名称 Semiconductor component and method of manufacture
摘要 A semiconductor component having a composite via structure with an enhanced aspect ratio and a method for manufacturing the semiconductor component. Vias having a first aspect ratio are formed in a contact layer disposed on a semiconductor substrate and filled with a metal. The metal is planarized and a dielectric layer is formed over the contact layer. Via extension structures having the same aspect ratio as those in the contact layer are formed in the dielectric layer and aligned with the vias in the contact layer. The vias in the dielectric layer are filled with metal and the metal is planarized. The contact vias in the contact layer and the dielectric layer cooperate to form a composite via structure having the enhanced aspect ratio. Additional dielectric layers having via structures can be included in the composite contact structure to further enhance the aspect ratio of the via structure.
申请公布号 US7319065(B1) 申请公布日期 2008.01.15
申请号 US20030637406 申请日期 2003.08.08
申请人 ADVANCED MICRO DEVICES, INC. 发明人 YU WEN;BESSER PAUL RAYMOND
分类号 H01L21/4763 主分类号 H01L21/4763
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