发明名称 Split gate multi-bit memory cell
摘要 A multi-bit memory cell ( 200 ) with a control gate ( 220 ) for controlling a middle portion of a channel region ( 208 ) provides improved operation including faster programming at smaller voltages and currents. The memory cell ( 200 ) includes a source ( 204 ) and a drain ( 206 ) diffused into a substrate ( 202 ) forming a channel region ( 208 ) therebetween. A first charge storing layer ( 214 ), a second charge storing layer ( 216 ) and the control gate ( 220 ) are formed on the substrate ( 202 ) over the channel region ( 208 ) and a gate ( 218 ) is formed over the source ( 204 ), the drain ( 206 ), the first and second charge storing layers ( 214, 216 ) and the control gate ( 220 ). Dielectric material ( 210, 212, 224, 226, 228 ) separates the source ( 204 ) and the drain ( 206 ) from the gate ( 218 ), and the control gate ( 220 ) from the first charge storing layer ( 214 ), the second charge storing layer ( 216 ) and the gate ( 218 ).
申请公布号 US7312495(B2) 申请公布日期 2007.12.25
申请号 US20050101783 申请日期 2005.04.07
申请人 SPANSION LLC 发明人 ZHENG WEI
分类号 H01L29/76 主分类号 H01L29/76
代理机构 代理人
主权项
地址