发明名称 |
A SEMICONDUCTOR DEVICE AND A METHOD OF MANUFACTURING THE SAME AND DESIGNING THE SAME |
摘要 |
<p>A semiconductor device and a manufacturing method thereof and a design method are provided to decrease a time for forming a mask by occupying a relatively wide area of dummy areas with a relatively large dummy pattern to restrict increase in an amount of coordinate data. An isolation layer is formed on a semiconductor substrate to define a device formation region(DA). A semiconductor device is formed on the isolation layer. An interlayer dielectric having a plurality of wiring fills the semiconductor device. The isolation layer is a region in which an insulating layer is buried in a groove within the substrate. The device formation region comprises an active region and a dummy region(FA). The dummy region comprises a plurality of first dummy patterns(DP1) and a plurality of second dummy patterns(DP2).</p> |
申请公布号 |
KR20070115848(A) |
申请公布日期 |
2007.12.06 |
申请号 |
KR20070117163 |
申请日期 |
2007.11.16 |
申请人 |
KABUSHIKI KAISHA HITACHI SEISAKUSHO(D/B/A HITACHI, LTD.);HITACHI ULSI SYSTEMS CO., LTD. |
发明人 |
KURODA KENICHI;WATANABE KOUZOU;YAMAMOTO HIROHIKO |
分类号 |
H01L21/76;H01L27/04;H01L21/301;H01L21/304;H01L21/3105;H01L21/3205;H01L21/762;H01L23/52;H01L23/528;H01L27/02;H01L27/08;H01L27/118 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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