发明名称 APPARATUS AND METHOD FOR MEASURING THE DAMAGE OF A STRUCTURE USING PIEZOELECTRIC DEVICES
摘要 An apparatus and a method for measuring the damage of a structure using piezoelectric devices are provided to easily measure an impedance resonance frequency within a wide frequency range by using a longitudinal elastic wave theory. An apparatus for measuring the damage of a structure using piezoelectric devices(30) includes a computer(60), at least one piezoelectric device, a stress applying unit(70), an impedance analyzer(50), and wires(51,52,53). The computer inputs a measuring frequency range, an excitation frequency step, and stores and displays measurement results. The piezoelectric device is attached to the opposite side to a measuring object. The stress applying unit applies the same stress to many positions. The impedance analyzer calculates an impedance using the electric potential change of the piezoelectric device by applying an AC signal, which corresponds to the measured frequency range and the excitation frequency step inputted from the computer, to the piezoelectric device. The wires interconnect the piezoelectric device and the impedance analyzer, and the impedance analyzer and the computer.
申请公布号 KR20070111845(A) 申请公布日期 2007.11.22
申请号 KR20060045165 申请日期 2006.05.19
申请人 INDUSTRIAL COOPERATION FOUNDATION CHONBUK NATIONAL UNIVERSITY 发明人 HONG, DONG PYO;KIM, YOUNG MOON;HONG, YONG
分类号 G01N29/04;G01B7/16 主分类号 G01N29/04
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