发明名称 PROBING APPARATUS AND PROBING METHOD
摘要 An inspection apparatus and an inspection method are provided to reduce an occupied space and to be transformed to a dual loader type inspection device and to enhance the inspection efficiency by connecting to a single loader type auto transfer line, without extending a foot-print of the single loader type. A probe room performs a test for an object. A loader room(11) is located along the side of the probe room. A cassette for storing the plural objects is mounted, two load ports(13A,13B) are located by separating each other, and a transfer instrument(14) is installed between the load ports and the probe room to transfer the objects within the loader room. Each load ports are located respectively along the transferring path of an auto transfer apparatus of the cassette.
申请公布号 KR20070109935(A) 申请公布日期 2007.11.15
申请号 KR20070045843 申请日期 2007.05.11
申请人 TOKYO ELECTRON LIMITED 发明人 HOSAKA HIROKI;AKIYAMA SHUJI;OBIKANE TADASHI
分类号 H01L21/66 主分类号 H01L21/66
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