发明名称 SUBSTRATE PROCESSING AND ALIGNMENT
摘要 PROBLEM TO BE SOLVED: To provide a method of efficiently manufacturing a substrate in which position information on a position of a process area on the substrate is retrieved with respect to an alignment mark to separate alignment and actual processing. SOLUTION: A substrate 5 can efficiently be manufactured by separating the alignment and the actual processing when an alignment mark 6a fixed with respect to the substrate 5 is provided, and when position information on a position of a process area on the substrate 5 is retrieved with respect to the alignment mark 6a before the substrate 5 is processed. In that case, alignment can be performed by redetermining the position of the alignment mark 6a only once, and by using the stored position information on the position of the process area during the processing. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007300072(A) 申请公布日期 2007.11.15
申请号 JP20070058370 申请日期 2007.03.08
申请人 THALLNER ERICH 发明人 THALLNER ERICH
分类号 H01L21/02;B82B1/00;B82B3/00;H01L21/027 主分类号 H01L21/02
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