发明名称 METHOD OF DEPOSITING DIELECTRIC LAYER WITH INCREASED GAP-FILL ABILITY
摘要 A method for depositing a dielectric layer is provided to increase a gap-fill property of the dielectric layer by reducing a deposition speed at an inlet hole while increasing the deposition speed at a lower portion of a groove. An inlet of a groove is processed to have a polarity, so that a source is not deposited on the inlet(S1). A dielectric layer is deposited(S2). The polarity process and the dielectric layer deposition process are alternatively performed for multiple times. A plasma surface treatment is performed by using a polar gas or a metal film deposition is used to perform the polarity process. A deposition speed at the inlet of the groove is smaller than the deposition speed at a lower portion of the groove, so that the dielectric layer is filled in the groove without generating a void. The dielectric layer is an undoped silicon, a silicon nitride film, or a silicon oxide film.
申请公布号 KR100773754(B1) 申请公布日期 2007.11.09
申请号 KR20060090380 申请日期 2006.09.19
申请人 INTEGRATED PROCESS SYSTEMS LTD. 发明人 LEE, KI HOON;YOU, DONG HO
分类号 H01L21/31;H01L21/76 主分类号 H01L21/31
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