发明名称 |
METHOD OF DEPOSITING DIELECTRIC LAYER WITH INCREASED GAP-FILL ABILITY |
摘要 |
A method for depositing a dielectric layer is provided to increase a gap-fill property of the dielectric layer by reducing a deposition speed at an inlet hole while increasing the deposition speed at a lower portion of a groove. An inlet of a groove is processed to have a polarity, so that a source is not deposited on the inlet(S1). A dielectric layer is deposited(S2). The polarity process and the dielectric layer deposition process are alternatively performed for multiple times. A plasma surface treatment is performed by using a polar gas or a metal film deposition is used to perform the polarity process. A deposition speed at the inlet of the groove is smaller than the deposition speed at a lower portion of the groove, so that the dielectric layer is filled in the groove without generating a void. The dielectric layer is an undoped silicon, a silicon nitride film, or a silicon oxide film.
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申请公布号 |
KR100773754(B1) |
申请公布日期 |
2007.11.09 |
申请号 |
KR20060090380 |
申请日期 |
2006.09.19 |
申请人 |
INTEGRATED PROCESS SYSTEMS LTD. |
发明人 |
LEE, KI HOON;YOU, DONG HO |
分类号 |
H01L21/31;H01L21/76 |
主分类号 |
H01L21/31 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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