发明名称 |
ULTRA VIOLET(UV) RADIATION TREATMENT METHODS FOR SUB ATMOSPHERIC CHEMICAL VAPOR DEPOSITION(SACVD) OF OZONE-TETRAETHOXYSILANE(O3-TEOS) |
摘要 |
An UV(Ultra Violet) radiation treatment method for an SACVD(Sub Atmospheric Chemical Vapor Deposition) of O3-TEOS(Ozone-Tetraethoxysilane) is provided to increase a tensile stress by shrinking an inside of a thin film by reducing an amount of moisture and silanol in the thin film. An UV radiation treatment method for an SACVD of O3-TEOS includes the steps of: forming an O3-TEOS layer(106) on a semiconductor substrate(100) by performing the SACVD of the O3-TEOS; and performing an UV process on the O3-TEOS. In the semiconductor substrate, a selective trench liner(104) and the O3-TEOS layer are buried in a trench(102). An STI(Shallow Trench Isolation) region(108) is defined by the SACVD O3-TEOS layer and the selective trench liner in the trench.
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申请公布号 |
KR20070103713(A) |
申请公布日期 |
2007.10.24 |
申请号 |
KR20070038515 |
申请日期 |
2007.04.19 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD.;CHARTERED SEMICONDUCTOR MANUFACTURING LTD.;INFINEON TECHNOLOGIES AG |
发明人 |
KIM, JUN JUNG;PARK, JAE EUN;WIDODO JOHNNY;SCHENK ANDRE;GUTMANN ALOIS;HAMPP ROLAND |
分类号 |
H01L21/205 |
主分类号 |
H01L21/205 |
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