V/I SOURCE AND TEST SYSTEM INCORPORATING THE SAME

摘要

A V/I-source, comprising a diode quad or an equivalent circuit having first through fourth nodes, a first current source connected to a 1st node of said diode quad, a second current source connected to a 2nd node of said diode quad opposite said first node, an op-amp having its output connected to a 3rd node of said diode quad and its non-inverting input being connected to a voltage source a feedback line arranged between a 4th node of said diode quad opposite said 3rd node and said inverting input of said op-amp. Furthermore, A test system for testing electronic devices, incorporating such a V/I-source and a method for providing a V/I-source and for testing an electronic device are provided.