| 发明名称 |
DEVICE AND METHOD FOR TESTING ELECTRONIC DEVICE |
| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an electronic device testing device and an electronic device testing method which precisely and simply testing an electronic device. <P>SOLUTION: This electronic device testing device 1 is equipped with: a test box 10 which the electronic device T is put in, and has shieldability for electric waves from outside and electric wave absorptivity for absorbing electric waves radiated inside; an antenna 20 for measurement for sending and receiving an electric wave with the antenna Ta of the electronic device T; and a mounting unit 30 for mounting the electronic device T. At least one of the antenna 20 and the mounting unit 30 has a means for performing adjustment so that the polarization plane of an electric wave radiated from the antenna 20 becomes parallel to the polarization plane of an electric wave radiated from the antenna Ta of the electronic device T. <P>COPYRIGHT: (C)2007,JPO&INPIT |
| 申请公布号 |
JP2007225567(A) |
申请公布日期 |
2007.09.06 |
| 申请号 |
JP20060050151 |
申请日期 |
2006.02.27 |
| 申请人 |
NIPPON LIGHT METAL CO LTD |
发明人 |
TASAKA HIDEAKI;SASADA MASAAKI;NAGASHIMA MICHIO;UCHIDA KATSUYA;YAMAMOTO KATSUSHI;NARISAWA AKIRA |
| 分类号 |
G01R29/10;G01R29/08;H04B7/26;H04B17/00 |
主分类号 |
G01R29/10 |
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