发明名称 PROBE PIN FOR PROBE CARD
摘要 PROBLEM TO BE SOLVED: To provide a probe pin having superior breaking characteristic in use, while having the characteristic capable of suppressing breakages or cracks of a bent part, when bent in manufacturing. SOLUTION: In this probe pin 1 for a probe card, including 1 to 10 wt.% platinum, 5 to 15 wt.% silver, and 10 to 20 wt.% either copper or the nickel or sum of both, and having the residual part comprising gold and an inevitable impurities, the tensile strength is set at 1,000 to 1,200 N/mm<SP>2</SP>, and the hardness Hv is set at 300 to 360, to thereby significantly reduce frequency of generation of breaking, when being used or bending in use. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007212139(A) 申请公布日期 2007.08.23
申请号 JP20060006304 申请日期 2006.01.13
申请人 TOKUSEN KOGYO CO LTD 发明人 HIMENO TETSUHISA
分类号 G01R1/067;C22C5/02;H01L21/66 主分类号 G01R1/067
代理机构 代理人
主权项
地址