| 摘要 |
PROBLEM TO BE SOLVED: To provide a voltage detector reduced in size by fine work for a semiconductor substrate, in the voltage detectors for detecting a hot-line state of a direct-current electric overhead line. SOLUTION: A value to be measured under the condition where a movable electrode 12 is not shifted is measured preliminarily, by a control part (not shown in Fig.). A fixed electrode 11 is charged therein when the overhead line L is under the hot-line state. The movable electrode 12 is also charged to bring the both electrodes into the same potential. Reaction force is generated between the both electrodes, and the movable electrode 12 receives force F along a side opposite to the fixed electrode 11. Resistance values of piezo-resistive elements 24a, 24b are changed by a distortion of a silicon substrate B, and an output of an amplifying part 25 is changed thereby. An output result from the amplifying part 25 is inputted into a control part, and the control part judges the hot-line state of the overhead line L, based on the output result. COPYRIGHT: (C)2007,JPO&INPIT
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