| 摘要 |
A system for testing components of a simulator has a slave device. A master controller is coupled to the slave device. The master controller transmits chip select and data signals to the slave device for testing a component of the simulator. A computer system is coupled to the master controller. The computer system displays at least one image of a control panel. A cursor of the computer system is placed on a desired component on the at least one image of the control panel. A test signal from the computer system is sent to the master controller for testing the component of the simulator.
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