| 摘要 |
PROBLEM TO BE SOLVED: To perform excess current detection with high precision, while enlarging a dynamic range in a driver circuit. SOLUTION: A semiconductor integrated circuit device outputs a detection signal of excess current when a comparator 6 in a driver IC 1 compares the drain voltage of a drive transistor 2 generated by driving a load with the drain voltage of a current sensing transistor 5 generated by bias current Ibias, and then detects that excess current flows into the drive transistor 2. As for the threshold current the comparator 6 detects, the threshold current in the drive transistor 2 is adjusted arbitrarily by adjusting the gate width sizes of the drive transistor 2 and the current sensing transistor 5. COPYRIGHT: (C)2007,JPO&INPIT
|
