发明名称 OXY-CHALCOGENIDE BASED THIN FILM, METHOD FOR GROWING THE SAME, OXIDE SEMICONDUCTOR THIN FILM METHOD FOR GROWING THE SAME, PROCESS FOR FABRICATING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a method for growing oxy-chalcogenide based thin film excellent in mass productivity in which a p-type layer can be obtained and an oxy-chalcogenide based thin film can be grown uniformly over a large area. <P>SOLUTION: Solution vaporization CVD is employed for growing an oxy-chalcogenide based thin film. For example, a Cu thin film 102 is formed on a substrate 101 such as a YSZ substrate or an MgO substrate and then an amorphous LaCuOS thin film 103 is grown by solution vaporization CVD. For example, La(EDMDD)<SB>3</SB>is employed as an La material, and Cu(EDMDD)<SB>2</SB>is employed as a Cu material. Growth temperature is set at 400&deg;C or less. Thereafter, the amorphous LaCuOS thin film 103 is crystallized by reactive solid phase epitaxial growth method thus obtaining a crystalline LaCuOS thin film 104. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007201032(A) 申请公布日期 2007.08.09
申请号 JP20060015868 申请日期 2006.01.25
申请人 SONY CORP 发明人 YOKOZEKI MIKIHIRO;SHIOMI HARUNORI;YANASHIMA KATSUNORI
分类号 H01L21/205;H01L33/28;H01L33/32 主分类号 H01L21/205
代理机构 代理人
主权项
地址