发明名称 |
Method and system for generating test pulses to test electronic elements |
摘要 |
A method and system for generating test pulses to test electronic elements are disclosed. After determining a transmission clock, which is smaller than a test clock, and a serial of predetermined pulses, the serial of data bits corresponding to the serial of predetermined pulses can be generated. Then the serial of data bits can be transformed into a serial data stream for transmission. By transmitting the serial data stream according to the transmission clock, the serial of predetermined pulses corresponding to the test clock can be generated.
|
申请公布号 |
US2007156368(A1) |
申请公布日期 |
2007.07.05 |
申请号 |
US20070707885 |
申请日期 |
2007.02.20 |
申请人 |
KING YUAN ELECTRONICS CO., LTD. |
发明人 |
CHANG SHIH-BOU;LIN DIANN-FANG |
分类号 |
G01R31/28;G01R31/3185;G01R31/319;H01L21/00 |
主分类号 |
G01R31/28 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|