发明名称 Manufacturing method for compound semiconductor device
摘要 It is the object of the present invention to provide a manufacturing method for a compound semiconductor device capable of removing remaining organic substances without deteriorating a characteristic of the compound semiconductor device, wherein a surface of an i-type AlGaAs schottky layer is cleaned in a state where light is blocked using either one of ozonized (O<SUB>3</SUB>) water whose ozone concentration is at most 13 mg/L and hydrogenated (H<SUB>2</SUB>) water whose hydrogen ion concentration (pH) is from 6 to 8 inclusive, or using both of the ozonized water and the hydrogenated water after a schottky electrode made of Ti/Al/Ti is evaporated onto the exposed i-type AlGaAs schottky layer and a lift-off operation is performed using a remover.
申请公布号 US7238542(B2) 申请公布日期 2007.07.03
申请号 US20040927441 申请日期 2004.08.27
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 KATO YOSHIAKI;YAMAGUCHI TUNEO;TAMURA AKIYOSHI
分类号 G03F7/42;H01L21/00;C11D7/50;C11D11/00;H01L21/027;H01L21/304;H01L21/306;H01L21/311;H01L21/335;H01L21/338;H01L29/778;H01L29/812 主分类号 G03F7/42
代理机构 代理人
主权项
地址