发明名称 Method of manufacturing semiconductor device, mask and semiconductor device
摘要 A method of manufacturing a semiconductor device answerable to refinement of circuits by correctly connecting adjacent small patterns with each other with excellent reproducibility in connective exposure and a semiconductor device manufactured by this method are proposed. According to this method of manufacturing a semiconductor device, connective exposure is performed by dividing a pattern formed on a semiconductor substrate into a plurality of patterns and exposing the plurality of divided patterns in a connective manner, by forming marks for adjusting arrangement of the patterns to be connected with each other on the semiconductor substrate before exposing patterns of a semiconductor element and connectively exposing the patterns of the semiconductor element in coincidence with the marks for adjusting arrangement.
申请公布号 US2007134564(A1) 申请公布日期 2007.06.14
申请号 US20060602505 申请日期 2006.11.21
申请人 MAEJIMA SHINROKU;SHIRAI SEIICHIRO;MACHIDA TAKAHIRO 发明人 MAEJIMA SHINROKU;SHIRAI SEIICHIRO;MACHIDA TAKAHIRO
分类号 G03C5/00;G03F1/00;G03F1/68;G03F9/00;H01L21/027 主分类号 G03C5/00
代理机构 代理人
主权项
地址