发明名称 Insulator and metallization method for VLSI devices with anisotropically-etched contact holes
摘要 In manufacture of VLSI semiconductor devices, the insulator surface upon which a metallization pattern is deposited must be smooth to facilitate lithographic operations. This requires the insulator to be thick and flowed or otherwise treated to eliminate steep edges. A contact hole etched in a thick insulator has steep sidewalls, however, and so chemical vapor deposition is preferrably used for the metallization so the sidewalls will be coated. A thin insulator coating is deposited after the contact holes are etched and prior to metallization to cover the low-resistance flowed insulator and self-align the contacts.
申请公布号 US4489481(A) 申请公布日期 1984.12.25
申请号 US19820420153 申请日期 1982.09.20
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 JONES, GARY W.
分类号 H01L21/3105;H01L21/768;(IPC1-7):H01L21/283 主分类号 H01L21/3105
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